smartWLI Systems in Paris and Beijing

The smartWLI systems are presented by our partners in Paris and Beijing.
At the International Conference on Metrology, held from September 19–21 in Paris, the systems will be showcased.

Schaefer Techniques / www.schaefer-tec.com

Sixth World Tribology Congress 2017 on the 17th – 22nd September in Beijing, booth 24/25
WinWinTec UG / www.winwintec.com

Using powerfull FPGA’s or grafic cards enables Speedytec the systems to an vertical scanning speed up to 150 µm still using the full xy resolution of an 2 MP camera. This peak values for white light interferometric sensors can be used to scan large objects with atomar height resolution as well as extrem high point densities. The algorithms are optimized for best results on steep flanks.

Fast scanning of an insert combining roughness and form measurements:

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