News & Updates

News from the world of GBS metrology

In our blog, we keep you updated on everything that moves us:
Learn more about technological innovations, exciting projects, current developments at GBS metrology, as well as our activities at conferences, training sessions, and trade shows worldwide.

Stay informed—about trends in 3D surface metrology, practical insights, and what drives us as a company.

Messbeispiel laterale Auflösung Profilometer
Knowledge & Tips
Requirements for the Lateral Resolution of a Profilometer

Optical profilometry has advanced rapidly in recent years. While it was once primarily evaluated by how well it could replace tactile instruments, modern optical 3D profilometers now set entirely new standards. Thanks to innovative sensor technology, they record several million measurement points per second and deliver exceptionally high resolution in all three spatial dimensions. This performance makes them reliable reference instruments across a wide range of applications – from research and development to industrial quality control.

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Messbeispiel: Vorteile optischer 3D-Sensoren
Knowledge & Tips
Optical 3D Sensors: Advantages of High-Resolution WLI Systems

In the metrology lab, dealing with unknown samples is a common challenge for many users. When customers require precise test measurements to determine the best system configuration for their tasks, choosing the smartWLI nimbus8among various optical 3D profilometers proves to be the ideal solution. This advanced system provides accurate reference data and offers advantages such as higher speed, superior resolution, and an optimized measurement workflow.

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Technology & Innovation
GBS accelerates wafer measurements

GBS, a leading company in optical 3D sensors based on coherence scanning (white-light) interferometry, now offers complete wafer measurement systems configured for use under cleanroom conditions.

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Applications & Projects
Expansion of series production

GBS mbH develops, manufactures, and distributes surface metrology technology for the detection and evaluation of micro-geometries, surface structures, and roughness.

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